All the NanoQI results!

Eight partners worked together to develop industry-ready, real-time, in-line technology for the characterization of nanomaterials. NanoQI optimized and combined X-ray diffraction analysis (XRD) and X-ray reflectometry (XRR) with novel hyperspectral imaging (HSI) technology to provide industry access to real-time assessment of nano-dimensions, structure and morphology of thin film nanomaterials, as well as correlative imaging of their homogeneity and defects.

Read a summary of what we have achieved below or contact us for further cooperation at