Optical Process Control & Monitoring in Thin-Film Production – Workshop – Registration Form

NanoQI: Hyperspectral Imaging & X-ray Solutions

Multi-modal combination of high-speed X-ray diffraction (XRD) and reflectivity (XRR) methods with hyper-spectral imaging (HSI) technology for nano-scale in-line and large-area quality control and process development of thin film materials

↓ Register below for a participation free of charge. In-person registration closes 24 March 2023↓

Venue location